3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise High Resolution analog Unit (2
3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise High Resolution analog Unit (2C Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening
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Ships within 48 hours · Estimated delivery Aug 1 - Aug 6